Research Article | Volume 2 Issue 1 (2026) | Published in 2026-01-07
Preparation And Optical Characterization Of CdSe Thin Films With Different Thicknesses Using Thermal Evaporation
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ABSTRACT
In this study, CdSe thin films with different thicknesses (300–900 nm) were prepared using the thermal evaporation technique. Structural and optical properties were investigated using X-ray diffraction (XRD), atomic force microscopy (AFM), and UV–Vis spectroscopy. XRD results confirmed a polycrystalline hexagonal structure with a preferred (002) orientation that became more pronounced with increasing thickness. Optical measurements revealed a direct band gap that decreased with increasing film thickness, accompanied by an increase in absorption coefficient in the visible region. AFM analysis showed improved surface morphology and increased grain size at higher thicknesses. These results indicate that CdSe thin films are promising candidates for optoelectronic and photovoltaic applications.
Keywords: Cdse; Thermal Evaporation; X-Ray; AFM; Polycrystalline.
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Article history
Received : Nov 18, 2025
Revised : Nov 19, 2025
Accepted : Dec 24, 2025
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Authors Affiliations
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Ethics declarations
Acknowledgment None Author Contribution All authors contributed equally to the main contributor to this paper. All authors read and approved the final paper. Conflicts of Interest “The authors declare no conflict of interest.” Funding “This research received no external funding”
